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Microelectronics Inspection System

Automated Optical Inspection (AOI) solutions provide a high level of defect detection for microelectronics in the production line.

The system covers defect types like: Incomplete coverage of the termination, Irregular termination, Presence of residues or flashes, Damaging of termination or Foreign Material, Glass coating damaged, Missing Electro-Mechanical Layer, Illegible marking, Cracks, Holes, Missing Coating, Out of dimension.

The system allows a speed of up to 1500 parts per minute.

1Vision provides an open platform with a software application that allows the customer the ability to define certain parameters for the image processing algorithms, such as areas of interest, edge parameters, and color characteristics.

The vision application stores the lots data. Lot number and part number is entered by a barcode reader.

The Lot data includes the following information: Lot number, Part number, Lot date/time, Total good parts, Total bad parts, Bad percentage, Part count for each defect, Statistical measurement data.

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